Analytik Jena – contrAA 800 Series
The contrAA 800 offers multi-element analysis with user-friendly operation—all at a manageable cost. Combining the strengths of conventional AAS and ICP-OES systems, it delivers high precision and performance while simplifying workflows. With just one lamp, it covers the entire AAS wavelength range, making it a powerful and efficient tool for modern laboratories.
High-Resolution Continuum Source (HR-CS) AAS
The contrAA 800 revolutionizes atomic absorption spectrometry by eliminating the need for lamp changes. Utilizing a single, high-intensity xenon short arc lamp, it covers the entire wavelength range required for AAS. At the heart of the system is a high-resolution spectrometer with a CCD detector, which generates a detailed 3D spectrum, ensuring outstanding detection limits down to the sub-ppb range and delivering maximum confidence in analytical results.
Thanks to its ability to perform fast sequential and multi-element analyses, the contrAA 800 significantly reduces measurement time and boosts sample throughput. Advanced software features, including automatic background correction (ABC) and the CSI tool, allow for reliable analysis even of challenging sample matrices.
The instrument’s sophisticated design unifies all atomization techniques—flame, graphite furnace, and hydride—into one compact, versatile platform. A wide range of intelligent accessories further enhances productivity, safety, and user-friendliness in routine laboratory operations. Additionally, the fully automated direct solid sampling feature removes the need for time-consuming sample digestion, streamlining the entire analysis process.
The contrAA 800 offers multi-element analysis and exceptional ease of use—all at a manageable cost. It brings together the strengths of both conventional AAS instruments and ICP-OES spectrometers. Designed to deliver high precision and performance, the system allows users to cover the full range of AAS applications using just a single lamp, making it a powerful and efficient solution for modern laboratories.
| Detector | Background correctıon | Wavelength precısıon | Lıght source | Spectral resolutıon | Wavelength range | Sensıtıvıty | Optıcal desıgn | |
|---|---|---|---|---|---|---|---|---|
| contrAA 800 D – HR-CS AAS for flame- and graphite furnace techniques 815-08002-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Flame: 0.015 mg/l 1%Abs (Cu 324) Graphite furnace: 0.66 µg/l 1%Abs (Pb 283) |
High-Resolution Echelle Spectrometer |
| contrAA 800 F – HR-CS AAS for flame technique 815-08000-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Flame: 0.015 mg/l 1%Abs (Cu 324) | High-Resolution Echelle Spectrometer |
| contrAA 800 G – HR-CS AAS for graphite furnace technique 815-08001-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Graphite furnace: 0.66 µg/l 1%Abs (Pb 283) | High-Resolution Echelle Spectrometer |
Standards
DIN 38405-35, DIN 38406-32, DIN 38406-33, DIN EN 14332, DIN EN ISO 12020, DIN EN ISO 15586, DIN EN ISO 5961, DIN ISO 11047
